Nanometrology

Nanometrology Photo

Nanometrology is the recent development emerged from metrology that concerns with quality-assured measurement, i.e. the two concepts – metrological traceability and measurement uncertainty – specifically at the nanoscale (1 nm – 100 nm). Some of the most common techniques used in nanometrology are atomic force microscopy, electron microscopy and X-ray diffraction. 

  • Atomic force microscopy
  • Scanning tunneling microscope
  • Electron microscope
  • Super resolution microscopy
  • Nanotribology

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