Nanometrology is the recent development emerged from metrology that concerns with quality-assured measurement, i.e. the two concepts – metrological traceability and measurement uncertainty – specifically at the nanoscale (1 nm – 100 nm). Some of the most common techniques used in nanometrology are atomic force microscopy, electron microscopy and X-ray diffraction.
Related: Nanoscience Conference | Nanoscience Congress | Nanotechnology Meeting | Nanotechnology Conference | Nanoscience Conferences
Related Conferences: International Conference on Nanoscience & Technology May 21-22, 2018 New York, USA | International Research Summit on Biomaterials and Nanotechnology July 16-17, 2018 Atlanta Georgia, USA | Annual Spring Conference and Expo on Chemical Engineering: From Materials Engineering to Nanotechnology April 4-5, 2018 Miami, Florida, USA | 6th World Congress and Expo on Nanotechnology and Material Science April 16-18, 2018 Valencia, Spain | International Conference on Nanoscience and Nanotechnology on Jan 29-Feb 2, 2018 at University of Wollongong, Australia | 17th Edition of International Conference on Emerging Trends in Materials Science and Nanotechnology on April 26-27, 2018 Rome, Italy | Nanotech 2018 Conference & Expo May 13-16, 2018 Anaheim, Canada.
Related Associations: Nanotechnology Industries Association (NIA); European Society for Precision Engineering and Nanotechnology (EUSPEN); Royal Society - Nanotechnology and Nanoscience; NanoBusiness Alliance; IEEE Nanotechnology Council; Canadian NanoBusiness Alliance (CNBA); American Academy of Nanomedicine (AANM); International Association of Nanotechnology (IANT); Nanotechnology and Nanoscience Student Association (NANSA); Czech Nanotechnology Industries Association; Nano Science and Technology Consortium (NSTC); Nano Technology Research Association; British Society for Nanomedicine.
All accepted abstracts will be published in respective Allied Academies Journals.
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